Nanoscopy: nanometre defect analysis by computer aided three dimensional optical imaging

Webpage : http://iopscience.iop.org/0957-4484/1/1/010

P. Montgomery

Nanotechnology , Volume 1 , page 54-62 - 1990

International journal Nanoscopy: nanometre defect analysis by computer aided three dimensional optical imaging, Nanotechnology, IOP Publishing ( SNIP : 0.717, SJR : 0.705 ), pages 54-62, Volume 1, juillet 1990, doi:10.1088/0957-4484/1/1/010 Research team : IPP

@Article{2-Mont90,
 author = {Montgomery, P.},
 title = {Nanoscopy: nanometre defect analysis by computer aided three dimensional optical imaging},
 journal = {Nanotechnology},
 volume = {1},
 pages = {54-62},
 month = {Jul},
 year = {1990},
 doi = {10.1088/0957-4484/1/1/010},
 x-international-audience = {Yes},
 x-language = {EN},
 url = {http://publis.icube.unistra.fr/2-Mont90}
}

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