Spatially-Resolved Spectroscopic Characterization of Reflective and Transparent Materials at a Micro-Meter Scale Using Coherence Scanning Interferometry

R. Claveau , P. Montgomery , M. Flury

Physica Status Solidi (c) - Current Topics in Solid State Physics , Volume 14 , Number 11 , page 1700157 - 2017

International journal Spatially-Resolved Spectroscopic Characterization of Reflective and Transparent Materials at a Micro-Meter Scale Using Coherence Scanning Interferometry, Physica Status Solidi (c) - Current Topics in Solid State Physics, Wiley-VCH Verlag ( SJR : 0.392 ), page 1700157, Volume 14, n° 11, novembre 2017, doi:10.1002/pssc.201700157 Research team : IPP
Platform : C3 Fab

@Article{2-CMF17,
 author = {Claveau, R. and Montgomery, P. and Flury, M.},
 title = {Spatially-Resolved Spectroscopic Characterization of Reflective and Transparent Materials at a Micro-Meter Scale Using Coherence Scanning Interferometry},
 journal = {Physica Status Solidi (c) - Current Topics in Solid State Physics},
 number = {11},
 volume = {14},
 pages = {1700157},
 month = {Nov},
 year = {2017},
 doi = {10.1002/pssc.201700157},
 x-international-audience = {Yes},
 x-language = {EN},
 url = {http://publis.icube.unistra.fr/2-CMF17}
}

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